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Design of a K-Band High-Linearity Asymmetric SPDT CMOS Switch Using a Stacked Transistor

Authors
Kim, TaehunLee, Hui DongPark, BonghyukJang, SeunghyunKong, SunwooPark, Changkun
Issue Date
Dec-2022
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Insertion loss; Loss measurement; Switching circuits; Transistors; Switches; Logic gates; Semiconductor device measurement; CMOS; high linearity; K-band; millimeter-wave (mm-wave); single-pole double-throw (SPDT); switch
Citation
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.32, no.12, pp.1443 - 1446
Journal Title
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
Volume
32
Number
12
Start Page
1443
End Page
1446
URI
http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/42977
DOI
10.1109/LMWC.2022.3192440
ISSN
1531-1309
Abstract
This study presents a high-linearity K-band single-pole double-throw (SPDT) switch with asymmetric topology in a 65-nm CMOS process for 5G applications. To simultaneously obtain high power-handling capability and high isolation in the Tx and Rx modes, respectively, we propose an SPDT switch using asymmetric topology and the stacked-transistor technique. In both the Tx/Rx modes, the proposed SPDT switch operates with an insertion loss of less than 2.1 dB and isolation better than 22.5 dB in the frequency range 20-25 GHz. At 22 GHz, the measurement results of the input 1-dB compression point (IP1dB) are 32.5 and 4.7 dBm in Tx and Rx modes, respectively. The chip core size of the proposed SPDT switch is 0.03 mm(2).
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Park, Chang kun
College of Information Technology (Department of Electronic Engineering)
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