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Sparse Code With Minimum Hamming Distance of Three for Spin-Torque Transfer Magnetic Random Access Memory
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open access
Nguyen, Thien An;
Lee, Jaejin
Article
Issue Date
2023
Citation
IEEE ACCESS, v.11, pp.114071 - 114079
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Improving Bit-Error-Rate Performance Using Modulation Coding Techniques for Spin-Torque Transfer Magnetic Random Access Memory
open access
Nguyen, Thien An;
Lee, Jaejin
Article
Issue Date
2023
Citation
IEEE ACCESS, v.11, pp.33005 - 33013
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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Nguyen, Thien An
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CIRCUIT
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error correction codes (ECCs)
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non-volatile RAM
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RAM
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sparse codes
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STT MRAM
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Asymmetric write error rate
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cascaded channel
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2023
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