Yoon, D.; Jung, D.; Seong, K.; Han, J.; Chung, K.; Kim, J.; Kim, T.T.; Baek, Kwang Hyun
ArticleIssue Date2022CitationIEEE Transactions on Very Large Scale Integration (VLSI) Systems, v.30, no.7, pp 915 - 925PublisherInstitute of Electrical and Electronics Engineers Inc.