Low-Temperature Postfunctionalization of Highly Conductive Oxide Thin-Films toward Solution-Based Large-Scale Electronics
- Authors
- Ban, Seok-Gyu; Kim, Kyung-Tae; Choi, Byung Doo; Jo, Jeong-Wan; Kim, Yong-Hoon; Facchetti, Antonio; Kim, Myung-Gil; Park, Sung Kyu
- Issue Date
- Aug-2017
- Publisher
- AMER CHEMICAL SOC
- Keywords
- transparent conducting electrodes; all-solution processed transparent large-scale electronics; thin film transistor; photochemically driven combustion process; low-temperature functionalization
- Citation
- ACS APPLIED MATERIALS & INTERFACES, v.9, no.31, pp 26191 - 26200
- Pages
- 10
- Journal Title
- ACS APPLIED MATERIALS & INTERFACES
- Volume
- 9
- Number
- 31
- Start Page
- 26191
- End Page
- 26200
- URI
- https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/4089
- DOI
- 10.1021/acsami.7b07528
- ISSN
- 1944-8244
1944-8252
- Abstract
- Although transparent conducting oxides (TCOs) have played a key role in a wide range of solid-state electronics from conventional optoelectronics to emerging electronic systems, the processing temperature and conductivity of solution-processed materials seem to be far exceeding the thermal limitations of soft materials and insufficient for high-perfomance large-area systems, respectively. Here, we report a strategy to form highly conductive and scalable solution-processed oxide materials and their successful translation into large-area electronic applications, which is enabled by photoassisted postfunctionalization at low temperature. The low-temperature fabrication of indium tin-oxide (ITO) thin films was achieved by using photoignited combustion synthesis combined with photoassisted reduction process under hydrogen atmosphere. It was noteworthy that the photochemically activated hydrogens on ITO surface could be triggered to facilitate highly crystalline oxygen deficient structure allowing significant increase of carrier concentration and mobility through film microstructure modifications. The low temperature postfunctionalized ITO films demonstrated conductivity of >1607 S/cm and sheet resistance of <104 Omega/square under the process temperature of less than 300 degrees C, which are comparable to those of vacuum-deposited and high-temperature annealed ITO films. Based on the photoassisted postfunctionalization route, all-solution-processed transparent metal-oxide thin-film transistors and large-area integrated circuits with the ITO bus lines were demonstrated, showing field-effect mobilities of >6.5 cm(2) V-1 s(-1) with relatively good operational stability and oscillation frequency of more than 1 MHz in 7-stage ring oscillators, respectively.
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Collections - College of ICT Engineering > School of Electrical and Electronics Engineering > 1. Journal Articles
- College of Natural Sciences > Department of Chemistry > 1. Journal Articles
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