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Additive-free superfilling in damascene Cu Electrodeposition using microcontact printing

Authors
Kim, Soo-KilKim, JJ
Issue Date
Sep-2004
Publisher
ELECTROCHEMICAL SOC INC
Citation
ELECTROCHEMICAL AND SOLID STATE LETTERS, v.7, no.9, pp C101 - C103
Journal Title
ELECTROCHEMICAL AND SOLID STATE LETTERS
Volume
7
Number
9
Start Page
C101
End Page
C103
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/42425
DOI
10.1149/1.1778932
ISSN
1099-0062
Abstract
To avoid complications brought about by employing organic additives, microcontact printing using a flat stamp was used in forming trench-selective Cu superfilling on damascene structure. Self-assembled monolayers of 1-decanethiol transferred on top surface of the trench could withstand the H2SO4 electrolyte and were used as a barrier for current transfer below a certain potential that was not yet dominated by the tunneling current. Subsequent electrodeposition on the printing area was successfully inhibited. The resulting filling profile was a defect-free superfilling with bumps on top. This is comparable to the three-additive system consisting of accelerator and two-component suppressor. (C) 2004 The Electrochemical Society.
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Kim, Soo Kil
창의ICT공과대학 (융합공학부)
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