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Intelligence Detection of DC Parallel Arc Failure with Featuring from Different Domains
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open access
Dang, Hoang-Long;
Kwak, Sangshin
; Choi, Seungdeog
Article
Issue Date
2024
Citation
IEEE Access, v.12, pp 56062 - 56076
Publisher
Institute of Electrical and Electronics Engineers Inc.
1
Discover
Author
Choi, Seungdeog
1
Kwak, Sang Shin
1
Subject
artificial learning models
1
DC parallel arc fault
1
feature characteristics
1
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Article
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ENG
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