Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Intelligence Detection of DC Parallel Arc Failure with Featuring from Different Domainsopen access

Authors
Dang, Hoang-LongKwak, SangshinChoi, Seungdeog
Issue Date
2024
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
DC parallel arc fault; feature characteristics; artificial learning models
Citation
IEEE Access, v.12, pp 56062 - 56076
Pages
15
Journal Title
IEEE Access
Volume
12
Start Page
56062
End Page
56076
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/73695
DOI
10.1109/ACCESS.2024.3389031
ISSN
2169-3536
Abstract
DC microgrids are increasingly becoming the backbone of renewable energy integration. Their ability to efficiently manage intermittent sources like solar and wind power is transforming the energy landscape. However, a critical challenge remains in the form of DC arc faults, which can significantly compromise the reliability and safety of these systems. Parallel arc faults represent a particularly challenging scenario due to their unique electrical behavior. Unlike series arc faults, which cause a decrease in system current, parallel arcs can lead to a significant increase in current due to the low resistance path they create. This research delves into the electrical behavior of DC systems during parallel arc faults. By analyzing the source current signals in different domains, the authors aim to identify specific characteristic features of the source current that can serve as reliable indicators combined with artificial learning models for arc fault diagnosis. The findings of this research can have significant implications for the improvement of advanced arc failure recognition systems. This research represents a valuable step towards improving the safety and reliability of DC systems by addressing the challenge of parallel arc fault detection. Authors
Files in This Item
Appears in
Collections
College of ICT Engineering > School of Electrical and Electronics Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kwak, Sang Shin photo

Kwak, Sang Shin
창의ICT공과대학 (전자전기공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE