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Nanoscale piezoresponse of 70 nm poly(vinylidene fluoride-trifluoro-ethylene) films annealed at different temperatures
- Authors
- Choi, Yoon-Young; Hong, Jongin; Hong, Seungbum; Song, Hanwook; Cheong, Deok-Soo; No, Kwangsoo
- Issue Date
- Apr-2010
- Publisher
- WILEY-BLACKWELL
- Keywords
- atomic force microscopy; dielectrics; thin film; polymers
- Citation
- PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.4, no.3-4, pp 94 - 96
- Pages
- 3
- Journal Title
- PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS
- Volume
- 4
- Number
- 3-4
- Start Page
- 94
- End Page
- 96
- ISSN
- 1862-6254
1862-6270
- Abstract
- In order to characterize the piezoelectric properties of 70 nm thick poly(vinylidene fluoride-trifluoroethylene), P(VDF-TrFE), films grown by a spin-coating technique, both nanoscale manipulation and polarization switching were studied using piezoresponse force Microscopy (PFM). We varied the annealing, temperature from 75 degrees C to 145 degrees C and achieved a high-quality 70 nm P(VDF-TrFE) film annealed at the temperature of 95 degrees C. Ferroelecrtic domains and their properties were confirmed using X-ray diffraction, grazing incidence reflection absorption Fourier, Transform Infrared (GIRA-FTIR) and PFM analysis. The ferroelectric domains in the film were homogeneously switchable below 5 V with a remnant d(33) of 14.9 pm/V. This offers out rationale for a promise in energy harvesting and switchability would be good for plastic electronics. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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