Irreversible Degradation Behaviors of an Electrolyte-gated Polyaniline (PANI) Nanowire Field-effect Transistor
- Authors
- Lee, Seung-Yong; Lee, Sang-Kwon; Lim, Hyuneui; Choi, Gyoung-Rin
- Issue Date
- Dec-2010
- Publisher
- KOREAN PHYSICAL SOC
- Keywords
- Polyaniline; Nanowire; Degradation; Coulombic repulsion
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.57, no.6, pp 1416 - 1420
- Pages
- 5
- Journal Title
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY
- Volume
- 57
- Number
- 6
- Start Page
- 1416
- End Page
- 1420
- URI
- https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/49797
- DOI
- 10.3938/jkps.57.1416
- ISSN
- 0374-4884
1976-8524
- Abstract
- We studied the degradation properties of a conducing polyaniline (PANI) nanowire field-effect transistor (FET) operating in a three-probe FET structure in an electrolyte solution on a SiO(2)/Si substrate. We observed that the current-voltage characteristics of an electrolyte-gated PANI nanowire FET swept for 13 cycles in a cyclic potential mode exhibited clear irreversible degradation, as shown by the drain current-gate voltage curves. We propose that the degradation of the PANI nanowire FET, which indicates a conductance loss and gain in the oxidation and reduction modes, respectively, is attributable to the intensity of Coulombic repulsion in the cycle mode.
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