Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors
DC Field | Value | Language |
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dc.contributor.author | Lee, Jeong-Min | - |
dc.contributor.author | Cho, In-Tak | - |
dc.contributor.author | Lee, Jong-Ho | - |
dc.contributor.author | Kwon, Hyuck-In | - |
dc.date.accessioned | 2021-10-26T05:40:28Z | - |
dc.date.available | 2021-10-26T05:40:28Z | - |
dc.date.issued | 2008-09 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.issn | 1077-3118 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/50723 | - |
dc.description.abstract | The experimental and modeling study of bias-stress-induced threshold voltage instabilities in amorphous indium-gallium-zinc oxide thin film transistors is reported. Positive stress results in a positive shift in the threshold voltage, while the transfer curve hardly moves when negative stress is induced. The time evolution of threshold voltage is described by the stretched-exponential equation, and the shift is attributed to the electron injection from the channel into interface/dielectric traps. The stress amplitudes and stress temperatures are considered as important factors in threshold voltage instabilities, and the stretched-exponential equation is well fitted in various bias temperature stress conditions. (c) 2008 American Institute of Physics. | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors | - |
dc.type | Article | - |
dc.identifier.doi | 10.1063/1.2977865 | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.93, no.9 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.wosid | 000258975800077 | - |
dc.citation.number | 9 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 93 | - |
dc.type.docType | Article | - |
dc.publisher.location | 미국 | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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