Fast and Stable Solution-Processed Transparent Oxide Thin-Film Transistor Circuits
DC Field | Value | Language |
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dc.contributor.author | Kim, Kwang Ho | - |
dc.contributor.author | Kim, Yong-Hoon | - |
dc.contributor.author | Kim, Hyun Jae | - |
dc.contributor.author | Han, Jeong-In | - |
dc.contributor.author | Park, Sung Kyu | - |
dc.date.accessioned | 2021-11-09T04:40:05Z | - |
dc.date.available | 2021-11-09T04:40:05Z | - |
dc.date.issued | 2011-04 | - |
dc.identifier.issn | 0741-3106 | - |
dc.identifier.issn | 1558-0563 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/51187 | - |
dc.description.abstract | Fast and stable zinc-tin-oxide (ZTO) thin-film transistor (TFT) circuits were fabricated by simple and effective solution processing. The solution-processed ZTO TFTs have shown saturation mobility > 2.5 +/- 0.29 cm(2)/V.s (W/L = 100/10 mu m) and subthreshold slope < 0.4 +/- 0.122 V/dec. The ZTO seven-stage ring oscillators have shown an oscillation frequency of similar to 800 kHz with a supply voltage V-DD = 60 V, corresponding to a propagation delay of < 90 ns per stage. In addition, with appropriate passivation onto the semiconductor channel area, the circuits have shown relatively stable operation even at a gate and source/drain bias voltage of > 50 V for several hours. | - |
dc.format.extent | 3 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Fast and Stable Solution-Processed Transparent Oxide Thin-Film Transistor Circuits | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/LED.2011.2107494 | - |
dc.identifier.bibliographicCitation | IEEE ELECTRON DEVICE LETTERS, v.32, no.4, pp 524 - 526 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.wosid | 000288664800032 | - |
dc.identifier.scopusid | 2-s2.0-79953033349 | - |
dc.citation.endPage | 526 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 524 | - |
dc.citation.title | IEEE ELECTRON DEVICE LETTERS | - |
dc.citation.volume | 32 | - |
dc.type.docType | Article | - |
dc.publisher.location | 미국 | - |
dc.subject.keywordAuthor | Ring oscillator | - |
dc.subject.keywordAuthor | solution process | - |
dc.subject.keywordAuthor | thin-film transistor (TFT) | - |
dc.subject.keywordAuthor | zinc-tin-oxide (ZTO) | - |
dc.subject.keywordPlus | ELECTRICAL CHARACTERISTICS | - |
dc.subject.keywordPlus | TFTS | - |
dc.subject.keywordPlus | GATE | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.description.journalRegisteredClass | sci | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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