Tunable physical properties of Al-doped ZnO thin films by O-2 and Ar plasma treatments
- Authors
- Joo, Young-Hee; Um, Doo-Seung; Kim, Chang-Il
- Issue Date
- Dec-2021
- Publisher
- IOP Publishing Ltd
- Keywords
- Al-doped ZnO (AZO); transparent conducting oxide (TCO); plasma treatment; work function; bandgap; surface roughness
- Citation
- MATERIALS RESEARCH EXPRESS, v.8, no.12
- Journal Title
- MATERIALS RESEARCH EXPRESS
- Volume
- 8
- Number
- 12
- URI
- https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/52799
- DOI
- 10.1088/2053-1591/ac3f0a
- ISSN
- 2053-1591
2053-1591
- Abstract
- Al-doped ZnO (AZO) is a promising transparent conducting oxide that can replace indium tin oxide (ITO) owing to its excellent flexibility and eco-friendly characteristics. However, it is difficult to immediately replace ITO with AZO because of the difference in their physical properties. Here, we study the changes in the physical properties of AZO thin films using Ar and O-2 plasma treatments. Ar plasma treatment causes the changes in the surface and physical properties of the AZO thin film. The surface roughness of the AZO thin film decreases, the work function and bandgap slightly increase, and the sheet resistance significantly decreases. In contrast, a large work function change is observed in the AZO thin film treated with O-2 plasma; however, the change in other characteristics is not significant. Therefore, the results indicate that post-treatment using plasma can accelerate the development of high-performance transparent devices.
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