Structure and dielectrical properties of (Pb,Sr)TiO3 thin films for tunable microwave device
DC Field | Value | Language |
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dc.contributor.author | Kim, KT | - |
dc.contributor.author | Kim, CI | - |
dc.date.accessioned | 2022-01-10T01:41:30Z | - |
dc.date.available | 2022-01-10T01:41:30Z | - |
dc.date.issued | 2002-12 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/53044 | - |
dc.description.abstract | The object of investigation is represented by PbxSr1-xTiO3 (PST) thin films, which were fabricated by the alkoxide-based solgel method on Pt/Ti/SiO2/Si substrate. We have investigated both structural and dielectric properties of PST thin films aimed to tunable microwave device applications as a function of Pb/Sr ratio. PST thin films showed typical polycrystalline structure with a dense microstructure without secondary phase formation. Dielectric properties of PST films were found as strongly dependent on Pb/Sr composition ratio. Increasing of Ph content leads to simultaneous increasing of both dielectric constant and dielectric loss characteristics of PST films. The figure of merit (FOM) parameter (FOM = (%) tunability/tan delta (%)) reached a maximal value of 27.5 corresponding to Pb/Sr ratio of 40/60. The tunability increased with increasing Pb content. The dielectric constants, dielectric loss and tunability of the PST thin films at Pb/Sr ratio of 40/60 measured at 100 kHz were 335, 0.0174 and 47.89%, respectively. (C) 2002 Elsevier Science B.V. All rights reserved. | - |
dc.format.extent | 4 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.title | Structure and dielectrical properties of (Pb,Sr)TiO3 thin films for tunable microwave device | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/S0040-6090(02)00849-0 | - |
dc.identifier.bibliographicCitation | THIN SOLID FILMS, v.420-421, pp 544 - 547 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.wosid | 000179922500091 | - |
dc.identifier.scopusid | 2-s2.0-0037011103 | - |
dc.citation.endPage | 547 | - |
dc.citation.startPage | 544 | - |
dc.citation.title | THIN SOLID FILMS | - |
dc.citation.volume | 420-421 | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.publisher.location | 스위스 | - |
dc.subject.keywordAuthor | PbxSr1-xTiO3 | - |
dc.subject.keywordAuthor | sol-gel | - |
dc.subject.keywordAuthor | thin film | - |
dc.subject.keywordAuthor | tunability | - |
dc.subject.keywordAuthor | dielectric properties | - |
dc.subject.keywordPlus | DEPOSITION | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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