Effect of grain size on the ferroelectric properties of Bi3.25La0.75Ti3O12 thin films
- Authors
- Kim, K.T.; Kim, C.I.; Kang, D.H.; Shim, I.W.
- Issue Date
- Nov-2002
- Publisher
- WORLD SCIENTIFIC PUBL CO PTE LTD
- Citation
- INTERNATIONAL JOURNAL OF MODERN PHYSICS B, v.16, no.28-29, pp 4469 - 4474
- Pages
- 6
- Journal Title
- INTERNATIONAL JOURNAL OF MODERN PHYSICS B
- Volume
- 16
- Number
- 28-29
- Start Page
- 4469
- End Page
- 4474
- URI
- https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/53045
- DOI
- 10.1142/S0217979202015637
- ISSN
- 0217-9792
1793-6578
- Abstract
- The Bi3.25La0.75Ti3O12 (BLT) thin films were prepared by metalorganic decomposition method The effect of grain size on ferroelectric properties' during crystallization were investigated by x-ray diffraction and field emission scanning electron microscope. The grain size and the roughness of BLT films increase with increasing of drying temperature. The leakage current densities of the BLT thin film with large grains are higher than that with small grains. The remanent polarization of BLT increases with increasing grain size. As compared BLT with,small grain size, the BLT film with larger grain size shows better fatigue properties. This may be explained that small grained films shows more degradation of switching charge than large grained films.
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Collections - College of ICT Engineering > School of Electrical and Electronics Engineering > 1. Journal Articles
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