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Effect of grain size on the ferroelectric properties of Bi3.25La0.75Ti3O12 thin films

Authors
Kim, K.T.Kim, C.I.Kang, D.H.Shim, I.W.
Issue Date
Nov-2002
Publisher
WORLD SCIENTIFIC PUBL CO PTE LTD
Citation
INTERNATIONAL JOURNAL OF MODERN PHYSICS B, v.16, no.28-29, pp 4469 - 4474
Pages
6
Journal Title
INTERNATIONAL JOURNAL OF MODERN PHYSICS B
Volume
16
Number
28-29
Start Page
4469
End Page
4474
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/53045
DOI
10.1142/S0217979202015637
ISSN
0217-9792
1793-6578
Abstract
The Bi3.25La0.75Ti3O12 (BLT) thin films were prepared by metalorganic decomposition method The effect of grain size on ferroelectric properties' during crystallization were investigated by x-ray diffraction and field emission scanning electron microscope. The grain size and the roughness of BLT films increase with increasing of drying temperature. The leakage current densities of the BLT thin film with large grains are higher than that with small grains. The remanent polarization of BLT increases with increasing grain size. As compared BLT with,small grain size, the BLT film with larger grain size shows better fatigue properties. This may be explained that small grained films shows more degradation of switching charge than large grained films.
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Kim, Chang Il
창의ICT공과대학 (전자전기공학부)
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