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TOF-SIMS and XPS analysis of ancient and forensic materials

Authors
Lee, YeonheeLee, JihyeHam, Seung WookLee, KangbongKim, Kang-Jin
Issue Date
Mar-2009
Publisher
AMER CHEMICAL SOC
Citation
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, v.237, pp 207 - 207
Pages
1
Journal Title
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY
Volume
237
Start Page
207
End Page
207
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/54208
ISSN
0065-7727
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자연과학대학 (화학과)
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