X-ray Irradiation Induced Reversible Resistance Change in Pt/TiO2/Pt Cellsopen access
- Authors
- Chang, Seo Hyoung; Kim, Jungho; Phatak, Charudatta; D'Aquila, Kenneth; Kim, Seong Keun; Kim, Jiyoon; Song, Seul Ji; Hwang, Cheol Seong; Eastman, Jeffrey A.; Freeland, John W.; Hong, Seungbum
- Issue Date
- Feb-2014
- Publisher
- AMER CHEMICAL SOC
- Keywords
- resistive switching; X-ray irradiation; photovoltaic effect; Magneli phase; Joule heating; defect generation
- Citation
- ACS NANO, v.8, no.2, pp 1584 - 1589
- Pages
- 6
- Journal Title
- ACS NANO
- Volume
- 8
- Number
- 2
- Start Page
- 1584
- End Page
- 1589
- URI
- https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/56862
- DOI
- 10.1021/nn405867p
- ISSN
- 1936-0851
1936-086X
- Abstract
- The interaction between X-rays and matter is an intriguing topic for both fundamental science and possible applications. In particular, synchrotron-based brilliant X-ray beams have been used as a powerful diagnostic tool to unveil nanoscale phenomena in functional materials. However, it has not been widely investigated how functional materials respond to the brilliant X-rays. Here, we report the X-ray-induced reversible resistance change in 40-nm-thick TiO2 films sandwiched by Pt top and bottom electrodes, and propose the physical mechanism behind the emergent phenomenon. Our findings indicate that there exists a photovoltaic-like effect, which modulates the resistance reversibly by a few orders of magnitude, depending on the intensity of impinging X-rays. We found that this effect, combined with the X-ray irradiation induced phase transition confirmed by transmission electron microscopy, triggers a nonvolatile reversible resistance change. Understanding X-ray-controlled reversible resistance changes can provide possibilities to control initial resistance states of functional materials, which could be useful for future information and energy storage devices.
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Collections - College of Natural Sciences > Department of Physics > 1. Journal Articles
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