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Scaling behaviors of reset voltages and currents in unipolar resistance switchingopen access

Authors
Lee, S. B.Chae, S. C.Chang, S. H.Lee, J. S.Seo, S.Kahng, B.Noh, T. W.
Issue Date
Nov-2008
Publisher
AMER INST PHYSICS
Keywords
capacitors; electrical conductivity transitions; nickel compounds; random-access storage
Citation
APPLIED PHYSICS LETTERS, v.93, no.21
Journal Title
APPLIED PHYSICS LETTERS
Volume
93
Number
21
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/56883
DOI
10.1063/1.3036532
ISSN
0003-6951
1077-3118
Abstract
The wide distributions of switching voltages in unipolar switching currently pose major obstacles for scientific advancement and practical applications. Using NiO capacitors, we investigated the distributions of the reset voltage and current. We found that they scaled with the resistance value R-o in the low resistance state and that the scaling exponents varied at R-o approximate to 30 Omega. We explain these intriguing scaling behaviors and their crossovers by analogy with percolation theory. We show that the connectivity of conducting filaments plays a crucial role in the reset process.
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Chang, Seo Hyoung
자연과학대학 (물리학과)
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