Scaling behaviors of reset voltages and currents in unipolar resistance switchingopen access
- Authors
- Lee, S. B.; Chae, S. C.; Chang, S. H.; Lee, J. S.; Seo, S.; Kahng, B.; Noh, T. W.
- Issue Date
- Nov-2008
- Publisher
- AMER INST PHYSICS
- Keywords
- capacitors; electrical conductivity transitions; nickel compounds; random-access storage
- Citation
- APPLIED PHYSICS LETTERS, v.93, no.21
- Journal Title
- APPLIED PHYSICS LETTERS
- Volume
- 93
- Number
- 21
- URI
- https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/56883
- DOI
- 10.1063/1.3036532
- ISSN
- 0003-6951
1077-3118
- Abstract
- The wide distributions of switching voltages in unipolar switching currently pose major obstacles for scientific advancement and practical applications. Using NiO capacitors, we investigated the distributions of the reset voltage and current. We found that they scaled with the resistance value R-o in the low resistance state and that the scaling exponents varied at R-o approximate to 30 Omega. We explain these intriguing scaling behaviors and their crossovers by analogy with percolation theory. We show that the connectivity of conducting filaments plays a crucial role in the reset process.
- Files in This Item
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- Appears in
Collections - College of Natural Sciences > Department of Physics > 1. Journal Articles
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