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Scanning low-temperature element-specific magnetic microscopy
- Authors
- Cady, A.; Haskel, Daniel; Lang, Jonathan C.; Srajer, George; Chupas, Peter J.; Osborn, Raymond; Mitchell, J.F.; Ahn, Jai-seok; Hur, N.; Park, Soonyong; Cheong, Sang-Wook
- Issue Date
- Jun-2005
- Publisher
- AMER INST PHYSICS
- Citation
- REVIEW OF SCIENTIFIC INSTRUMENTS, v.76, no.6
- Journal Title
- REVIEW OF SCIENTIFIC INSTRUMENTS
- Volume
- 76
- Number
- 6
- ISSN
- 0034-6748
1089-7623
- Abstract
- We have developed a low-temperature element-specific magnetic microscopy instrument at beamline 4-ID-D of the Advanced Photon Source. The setup enables simultaneous chemical and magnetic characterization of materials with similar to 1 mu m(2) resolution at low temperature (> 10 K) under a moderate applied field (< 0.8 T). We demonstrate the potential of this apparatus by presenting results correlating chemical and magnetic local behavior in inhomogeneous layered manganites and multiferroic systems. (c) 2005 American Institute of Physics.
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Collections - College of Natural Sciences > Department of Physics > 1. Journal Articles
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