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Generation of interface states due to quantum-dot growth in Au/GaAs Schottky Diode structures

Authors
Choi, W.Nam, H.Lee, J.Yu, B.Song, J.Yang, H.Chovet, A.
Issue Date
Sep-2005
Keywords
GaAs; InAs; Interface states; Low-frequency noise; Quantum-dots; Random walk; Schottky diodes
Citation
AIP Conference Proceedings, v.780, pp 109 - 112
Pages
4
Journal Title
AIP Conference Proceedings
Volume
780
Start Page
109
End Page
112
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/65482
DOI
10.1063/1.2036710
ISSN
0094-243X
Abstract
We investigated the low-frequency excess electrical noise characteristics of Au/GaAs Shottky diodes with and without self-assembled InAs quantum-dot layer grown by molecular beam epitaxy. The noise intensity shows 1/f behavior and non-quadratic current dependences. The current dependence is explained by the generation of interface states increasing toward the conduction band edge, in the diodes with quantum-dot layer, utilizing the model of random walk of electrons involving interface states. The extracted energy distributions of the interface states for the diodes with and without quantum-dot layer, are presented. © 2005 American Institute of Physics.
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