High-speed thermoreflectance microscopy using charge-coupled device-based Fourier-domain filtering
- Authors
- Choi, Woo June; Ryu, Seon Young; Kim, Jun Ki; Kim, Dong Uk; Kim, Geon Hee; Chang, Ki Soo
- Issue Date
- Sep-2013
- Publisher
- OPTICAL SOC AMER
- Citation
- OPTICS LETTERS, v.38, no.18, pp 3581 - 3584
- Pages
- 4
- Journal Title
- OPTICS LETTERS
- Volume
- 38
- Number
- 18
- Start Page
- 3581
- End Page
- 3584
- URI
- https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/67990
- DOI
- 10.1364/OL.38.003581
- ISSN
- 0146-9592
1539-4794
- Abstract
- We present a Fourier-domain filtering method for charge-coupled device (CCD)-based thermoreflectance microscopy to improve the thermal imaging speed while maintaining high thermal sensitivity. The time-varying reflected light distribution from the surface of bias-modulated microresistor was recorded by a CCD camera in free-run mode and converted to the frequency domain using the fast Fourier transform (FFT) for all pixels of the CCD. After frequency peak filtering followed by inverse FFT, a thermoreflectance image was obtained. The imaging results of the proposed method were quantitatively compared with those of the conventional four-bucket method, showing that the Fourier-domain filtering method can provide thermal imaging 24-42 times faster than the four-bucket method, depending on the required thermal sensitivity. (C) 2013 Optical Society of America
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Collections - College of ICT Engineering > School of Electrical and Electronics Engineering > 1. Journal Articles
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