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Integrate-and-Fire (I&F) Neuron Circuit Using Resistive-Switching Random Access Memory (RRAM)

Authors
Kwon, Min-WooKim, SungjunKim, Min-HwiPark, JungjinKim, HyungjinHwang, SungminPark, Byung-Gook
Issue Date
May-2017
Publisher
AMER SCIENTIFIC PUBLISHERS
Keywords
Neuromorphic; I&F Neuron Circuit; Action-Potential; Resistive-Switching Random Access Memory
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.17, no.5, pp 3038 - 3041
Pages
4
Journal Title
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
Volume
17
Number
5
Start Page
3038
End Page
3041
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/72151
DOI
10.1166/jnn.2017.14025
ISSN
1533-4880
1533-4899
Abstract
We proposed the analog integrate and fire (I&F) neuron circuit using resistive-switching random access memory (RRAM). And we emulated the essential characteristics of the biological neuron such as temporal integration, threshold triggering, output generation and refractory period. The RRAM cell was made by Ag/Si3N4/TiN structure and measured DC I-V curve and transient pulse characteristics. We modelled the RRAM operation by spice simulation. With the RRAM model and conventional CMOS device, we simulated the I&F neuron circuit using smart spice tool. It was possible to reduce the power consumption, delay and neuron circuit cell size effectively by using the RRAM without capacitor.
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창의ICT공과대학 (전자전기공학부)
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