Hyperspectral imaging of complex dielectric functions in 2D materials
- Authors
- Kim, Un Jeong; Han, Yoojoong; Nugera, Florence A.; Yun, Seok Joon; Kim, Seok In; Lee, Moonsang; Gutiérrez, Humberto R.; Lee, Young Hee; Son, Hyungbin
- Issue Date
- Apr-2024
- Publisher
- Elsevier B.V.
- Keywords
- Extinction coefficient; Hyperspectral phase microscopy; Refractive index; Spatially-resolved complex dielectric function; Transition metal dichalcogenides
- Citation
- Nano Today, v.55
- Journal Title
- Nano Today
- Volume
- 55
- URI
- https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/72887
- DOI
- 10.1016/j.nantod.2024.102170
- ISSN
- 1748-0132
1878-044X
- Abstract
- It remains a challenge to characterize inhomogeneities in two-dimensional (2D) layered materials associated with strain and defects. Spectroscopic ellipsometry and reflectance/transmittance measurement can be used to characterize complex dielectric functions. However, these techniques are not well suited for submicron spectroscopic imaging of inhomogeneities across a macroscale sample. Here, we report hyperspectral phase microscopy (HPM) to image spatially-resolved complex dielectric functions of refractive index and extinction coefficient of transition metal dichalcogenides. This was implemented by measuring wavelength-dependent phase shifts in optical interference, which were then analyzed by a simple Kramers-Kronig-consistent model. We successfully image not only the phase difference but also patterns of modulated carrier density and strain in mono-/bi-layer heterostructured transition metal dichalcogenides. © 2024 Elsevier Ltd
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