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First-Principles Study of Square-Octagon Lines Defects in Monolayer Hexagonal Boron Nitride

Authors
Jeong, JinwooYoon, Young-Gui
Issue Date
Jun-2015
Publisher
AMER SCIENTIFIC PUBLISHERS
Keywords
BN; Monolayer; Defect; Energy Barrier; Energetics
Citation
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, v.10, no.3, pp 419 - 423
Pages
5
Journal Title
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS
Volume
10
Number
3
Start Page
419
End Page
423
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/9534
DOI
10.1166/jno.2015.1761
ISSN
1555-130X
1555-1318
Abstract
We study line square-octagon (4 vertical bar 8) defects in monolayer hexagonal boron nitride from first-principles. The defect formation energies are calculated both for symmetric and asymmetric defect structures. The calculated defect formation energies of the asymmetric defect structures, involving only the B-N bonds, are around 1.71 similar to 1.86 eV per 4 vertical bar 8 defect, whereas those of symmetric defect structures, involving all the B-N, B-B, and N-N bonds, are around 5.62 similar to 5.65 eV per 4 vertical bar 8 defect. The energy barrier for the slip of the BN atomic chain, calculated from the nudged elastic band method, is about 7.5 eV per 4 vertical bar 8 defect.
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