Photo-Activated Indium-Strontium-Zinc-Oxide Thin-Film Transistors Using a Strontium Nitrate Precursor
- Authors
- Lee, Woobin; Lee, Minkyung; Yi, Gyeong Min; Park, Sung Kyu; Kim, Yong-Hoon
- Issue Date
- Jun-2015
- Publisher
- AMER SCIENTIFIC PUBLISHERS
- Keywords
- ISZO; Strontium Nitrate; Photochemical Activation; Thin-Film Transistor
- Citation
- JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, v.10, no.3, pp 366 - 370
- Pages
- 5
- Journal Title
- JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS
- Volume
- 10
- Number
- 3
- Start Page
- 366
- End Page
- 370
- URI
- https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/9540
- DOI
- 10.1166/jno.2015.1751
- ISSN
- 1555-130X
1555-1318
- Abstract
- Photochemically activated indium-strontium-zinc oxide (ISZO) thin-film transistors ( TFTs) are fabricated by using strontium nitrate as a metallic precursor. The formulated ISZO precursor solutions had a broad absorption characteristic in the ultraviolet region as compared to the IGZO precursor solution. Photochemical activation, which is mediated by deep ultraviolet irradiation in N-2 atmosphere, allowed formation of a dense ISZO and ISO semiconductor films at a low temperature. By optimizing the incorporated strontium composition, ISZO TFTs with an average field-effect mobility of 2.15 cm(2)/Vs, on/off ratio of similar to 10(7), and subthreshold slope of 0.71 V/decade were obtained. In addition, we investigated the positive gate-bias stress characteristics of the ISZO TFTs. The fabricated ISZO TFTs exhibited a positive threshold voltage shift similar to that of IGZO TFTs.
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