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Browsing by Ban, YoojinAuthor

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Insertion loss and polarization-dependent loss measurement improvement to enable parallel silicon photonics wafer-level testing

Kim, Daehong; De Coster, Jeroen; Van Campenhout, Joris; Ban, Yoojin; Velenis, Dimitrios; Sar, Huseyin; Kobbi, Hakim; Magdziak, Rafal; Kim, Younghyun

ArticleIssue Date2025CitationOptics and Lasers in Engineering, v.186PublisherElsevier Ltd

SCIESCOPUS

Large-signal SPICE model for depletion-type silicon ring modulators Go to Link

Kim, Minkyu; Shin, Myungjin; Kim, Min-Hyeong; Yu, Byung-Min; 김영현; Ban, Yoojin; Lischke, Stefan; Mai, Christian; Zimmermann, Lars; Choi, Woo-Young

ArticleIssue Date2019CitationPHOTONICS RESEARCH, v.7, no.9, pp.948 - 954PublisherOPTICAL SOC AMER

SCOPUS

Simulation Study of a Monolithic III-V/Si V-Groove Carrier Depletion Optical Phase Shifter Go to Link

Kim, Sanghyeon; 김영현; Ban, Yoojin; Marianna Pantouvaki; Joris Van Campenhout

ArticleIssue Date2020CitationIEEE Journal of Quantum Electronics, v.56, no.2, pp 1 - 8PublisherInstitute of Electrical and Electronics Engineers

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Browsing by Ban, YoojinAuthor

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