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Analysis of transient degradation behaviors of organic light-emitting diodes under electrical stressGo to Linkopen access

Lee, Gyeong Won; Choi, Yoonsuk; Kim, Heejin; Park, Jongwoo; Shim, Jong-In; Shin, Dong-Soo

ArticleIssue Date2021CitationApplied Sciences-basel, v.11, no.16, pp 1 - 10PublisherMDPI
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