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Analysis of efficiency droop in 280-nm AlGaN multiple-quantum-well light-emitting diodes based on carrier rate equationGo to Link

Yun, Joosun; Shim, Jong-In; Hirayama, Hideki

ArticleIssue Date2015CitationApplied Physics Express, v.8, no.2, pp 1 - 4PublisherJapan Soc of Applied Physics
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