Kim, Heejin; Lee, Jongwon; Bang, Juhyun; Lee, Boram; Hwang, Youngsun; Park, Jongwoo; Lee, Kyungwon; Shin, Dong Soo
ArticleIssue Date2017CitationIEEE International Reliability Physics Symposium Proceedings, pp.6C6.1 - 6C6.6PublisherInstitute of Electrical and Electronics Engineers Inc.