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Fast cell level characterization and reliability evaluation for advanced flexible mobile display
- Authors
- Kim, Heejin; Lee, Jongwon; Bang, Juhyun; Lee, Boram; Hwang, Youngsun; Park, Jongwoo; Lee, Kyungwon; Shin, Dong Soo
- Issue Date
- Jun-2017
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Keywords
- C-V (capacitance-voltage); cell level reliability; charge transfer mechanism; EL (emissive layer); L-I-V (luminance-current voltage); OLED (organic light emitting diode)
- Citation
- IEEE International Reliability Physics Symposium Proceedings, pp.6C6.1 - 6C6.6
- Indexed
- SCOPUS
- Start Page
- 6C6.1
- End Page
- 6C6.6
- ISSN
- 1541-7026
- Abstract
- For an advanced flexible mobile display, the elucidation of the charge transfer mechanism of an emissive layer (EL) in an organic light-emitting diode (OLED) is crucial to ensure performance and reliability. To determine the long-Term lifetime characteristics, two different ELs were exposed to an accelerated stress test on the cell level and then characterized by luminance-current-voltage (L-I-V), capacitance-voltage (C-V), and impedance measurements. In addition, LDI-TOF analysis was employed for the physical characterization. With a specific test structure, we were able to accelerate the EL degradation, providing fast turnaround results compared to the conventional aging test on the module level. Finally, the optimization of the EL structure is discussed from the reliability perspective. © 2017 IEEE.
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Related Researcher
- Shin, Dong Soo
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)