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Defect-induced degradation of rectification properties of aged Pt/n-InxZn1-xOy Schottky diodesGo to Link

Kim, K. H.; Kang, B. S.; Lee, M. -J.; Ahn, S. -E.; Lee, C. B.; Stefanovich, G.; Xianyu, W. X.; Kim, K. -K.; Kim, J. S.; Yoo, I. K., et al.

ArticleIssue Date2008CitationAPPLIED PHYSICS LETTERS, v.92, no.23, pp 1 - 4PublisherAMER INST PHYSICS
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