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Avoiding fatal damage to the top electrodes when forming unipolar resistance switching in nano-thick material systemsGo to Link

Lee, S. B.; Kwon, D-H; Kim, K.; Yoo, H. K.; Sinn, S.; Kim, M.; Kahng, B.; Kang, B. S.

ArticleIssue Date2012CitationJOURNAL OF PHYSICS D-APPLIED PHYSICS, v.45, no.25, pp 1 - 7PublisherIOP PUBLISHING LTD
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