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Correctable and uncorrectable errors using large scale DRAM DIMMs in replacement network servers Go to Link

Baeg, Sanghyeon; Qasim, Mirza; Kwon, Junhyeong; Li, Tan; Gupta, Nilay; Wen, Shi-Jie; Kolli, Satyadev

ArticleIssue Date2019CitationMICROELECTRONICS RELIABILITY, v.99, pp 104 - 112PublisherPERGAMON-ELSEVIER SCIENCE LTD

SCIESCOPUSKCI

Experimental Exploitation of Random and Deterministic Data Patterns for Stringent DDR4 I/O Timing Margins Go to Link

Lee, Kiseok; Li, Tan; Baeg, Sanghyeon

ArticleIssue Date2019CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.19, no.4, pp 388 - 395PublisherIEEK PUBLICATION CENTER

SCISCIESCOPUS

Failure signature analysis of power-opens in DDR3 SDRAMs Go to Link

Li, Tan; Lee, Hosung; Bak, Geunyong; Baeg, Sanghyeon

ArticleIssue Date2018CitationMICROELECTRONICS RELIABILITY, v.88-90, pp 277 - 281PublisherPERGAMON-ELSEVIER SCIENCE LTD

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Browsing by Li, TanAuthor

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