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Polarization dynamics of the ferroelectric hafnium zirconium oxide thin-film capacitor during the relaxation process

Kim, Cheol Jun; Ku, Minkyung; Kim, Tae Hoon; Noh, Taehee; Kang, Minu; Seong, Hyeon Su; Kang, Seung Jin; Shin, YoonChul; Ahn, Ji-Hoon; Kang, Bo Soo

ArticleIssue Date2025CitationApplied Physics Letters, v.126, no.10PublisherAmerican Institute of Physics
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