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Browsing by Wong, RichardAuthor

Showing results 1 to 17 of 17

SCISCIESCOPUS

A 65 nm Temporally Hardened Flip-Flop Circuit Go to Link

Li, Y. -Q.; Wang, H. -B.; Liu, Rui; Chen, Li; Nofal, Issam; Chen, Q. -Y.; He, A. -L.; Guo, Gang; Baeg, Sang H.; Wen, Shi-Jie, et al.

ArticleIssue Date2016CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.63, no.6, pp 2934 - 2940PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

AC-DC factor sensitivity for DRAM components lifetime under hot-carrier injection Go to Link

Baeg, Sanghyeon; Nam, Haewoon; Chia, Pierre; Wen, Shijie; Wong, Richard

ArticleIssue Date2011CitationIEEE International Reliability Physics Symposium Proceedings, pp - 4PublisherIEEE

SCOPUS

Active-precharge hammering on a row induced failure in DDR3 SDRAMs under 3× nm technology Go to Link

Park, Kyungbae; Baeg, Sanghyeon; Wen, Shijie; Wong, Richard

ArticleIssue Date2015CitationIEEE International Integrated Reliability Workshop Final Report, v.2015, pp 82 - 85PublisherInstitute of Electrical and Electronics Engineers Inc.

SCIESCOPUS

Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations Go to Link

Jung, Changmin; Baeg, Sanghyeon; Wen, Shihie; Wong, Richard

ArticleIssue Date2011CitationProceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, pp 390 - 397PublisherIEEE

SCIESCOPUS

DRAM failure cases under hot-carrier injection Go to Link

Baeg, Sanghyeon; Chia, Pierre; Wen, Shijie; Wong, Richard

ArticleIssue Date2011CitationProceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, pp 1 - 3PublisherIEEE

SCOPUS

Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams Go to Link

Bak, Geunyong; Lee, Soonyoung; Lee, Hosung; Park, Kyungbae; Baeg, Sanghyeon; Wen, Shijie; Wong, Richard; Slayman, Charlie

ArticleIssue Date2015CitationIEEE International Reliability Physics Symposium Proceedings, v.2015, pp SE31 - SE35PublisherInstitute of Electrical and Electronics Engineers Inc.

SCIESCOPUS

Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals Go to Link

Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard

ArticleIssue Date2010CitationIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.57, no.4, pp 814 - 822PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

Mitigating the Effects of Large Multiple Cell Upsets (MCUs) in Memories Go to Link

Antonio Maestro, Juan; Reviriego, Pedro; Baeg, Sanghyeon; Wen, Shijie; Wong, Richard

ArticleIssue Date2011CitationACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, v.16, no.4, pp 1 - 10PublisherASSOC COMPUTING MACHINERY

SCISCIESCOPUS

Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree Go to Link

Li, Yuanqing; Chen, Li; Nofal, Issam; Chen, Mo; Wang, Haibin; Liu, Rui; Chen, Qingyu; Krstic, Milos; Shi, Shuting; Guo, Gang, et al.

ArticleIssue Date2018CitationMICROELECTRONICS RELIABILITY, v.87, pp 24 - 32PublisherPERGAMON-ELSEVIER SCIENCE LTD

SCISCIESCOPUS

Protection of Memories Suffering MCUs Through the Selection of the Optimal Interleaving Distance Go to Link

Reviriego, Pedro; Antonio Maestro, Juan; Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard

ArticleIssue Date2010CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.57, no.4, pp 2124 - 2128PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCOPUS

Selection of the optimal interleaving distance for memories suffering MCUs Go to Link

Reviriego, Pedro; Maestro, Juan Antonio; Baeg, Sanghyeon; Wen, Shijie; Wong, Richard

ArticleIssue Date2009Citation10th European Conference on Radiation Effects on Components and Systems, pp 1 - 4PublisherIEEE

SCIESCOPUS

Soft error study on DDR4 SDRAMs using a 480 MeV proton beam Go to Link

Park, Myungsang; Jeon, Sanghoon; Bak, Geunyong; Lim, Chulseung; Baeg, Sanghyeon; Wen, Shijie; Wong, Richard; Yu, Nick

ArticleIssue Date2017CitationIEEE International Reliability Physics Symposium Proceedings, pp 1 - 6PublisherInstitute of Electrical and Electronics Engineers Inc.

SCIESCOPUS

Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication Go to Link

Maestro, Juan Antonio; Reviriego, Pedro; Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard

ArticleIssue Date2013CitationMICROPROCESSORS AND MICROSYSTEMS, v.37, no.8, pp 1103 - 1107PublisherELSEVIER

SCIESCOPUS

SRAM Interleaving Distance Selection With a Soft Error Failure Model Go to Link

Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard

ArticleIssue Date2009CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.56, no.4, pp 2111 - 2118PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCISCIESCOPUS

Stuck Bits Study in DDR3 SDRAMs Using 45-MeV Proton Beam Go to Link

Lim, Chulseung; Jeong, Hyun Soo; Bak, Geunyong; Baeg, Sanghyeon; Wen, Shi-Jie; Wong, Richard

ArticleIssue Date2015CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.62, no.2, pp 520 - 526PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCISCIESCOPUS

Study of proton radiation effect to row hammer fault in DDR4 SDRAMs Go to Link

Lim, Chulseung; Park, Kyungbae; Bak, Geunyong; Yun, Donghyuk; Park, Myungsang; Baeg, Sanghyeon; Wen, Shi-Jie; Wong, Richard

ArticleIssue Date2018CitationMICROELECTRONICS RELIABILITY, v.80, pp 85 - 90PublisherPERGAMON-ELSEVIER SCIENCE LTD

SCISCIESCOPUS

Supply Voltage Dependence of Heavy Ion Induced SEEs on 65 nm CMOS Bulk SRAMs Go to Link

Wu, Qiong; Li, Yuanqing; Chen, Li; He, Anlin; Guo, Gang; Baeg, Sang H.; Wang, Haibin; Liu, Rui; Li, Lixiang; Wen, Shi-Jie, et al.

ArticleIssue Date2015CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.62, no.4, pp 1898 - 1904PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

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