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Extracting the inherent ideality factor of a diode from electrical current-voltage characteristicsGo to Linkopen access

Park, Jaehyeok; Yu, Chaeyoon; Min, Sangjin; Shim, Jong-In; Shin, Dong-Soo

ArticleIssue Date2023CitationElectronics Letters, v.59, no.23, pp 1 - 2PublisherInstitute of Electrical Engineers
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