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Enabling test/diagnosis of automotive semiconductor chips through FlexRay network
- Issue Date
- Nov-2017
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Keywords
- FlexRay network; scan-test technique for semiconductor chips; vehicle control networks
- Citation
- 2017 International Conference on Electrical and Computing Technologies and Applications, ICECTA 2017, pp.1 - 5
- Indexed
- SCIE
SCOPUS
- Journal Title
- 2017 International Conference on Electrical and Computing Technologies and Applications, ICECTA 2017
- Start Page
- 1
- End Page
- 5
- Abstract
- The demand to ensure the safety, reliability and comfort in automobiles has increased the complexity of in-vehicle electronic systems. Like mechanical maintenance, regular monitoring of the health of semiconductor chips is also important. This paper presents a framework for a low abstraction level maintenance of semiconductor chips of the vehicular network nodes through FlexRay network, while complying with the FlexRay protocol. The proposed framework is demonstrated with the scan-test data transportation. ? 2017 IEEE.
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