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Analytical Model of the Vertical Pinned Photodiode

Authors
Lee, Jiwonvan Sieleghem, EdwardKim, HyunwooGenoe, Jan
Issue Date
Oct-2022
Publisher
Institute of Electrical and Electronics Engineers
Keywords
Active pixel sensors; CMOS image sensors (CISs); image sensors; photodiodes
Citation
IEEE Transactions on Electron Devices, v.69, no.10, pp 5603 - 5606
Pages
4
Indexed
SCIE
SCOPUS
Journal Title
IEEE Transactions on Electron Devices
Volume
69
Number
10
Start Page
5603
End Page
5606
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/111532
DOI
10.1109/TED.2022.3198026
ISSN
0018-9383
1557-9646
Abstract
This article presents a simple analytical model of the vertical pinned photodiode (PPD). In the existing pixels with relatively large sizes, the photodiode is formed by p(+)-n-p doping in a planar manner, and thus the vertical electric field determines the potential of the photodiode. However, as the pixel size becomes smaller, the size of the photodiode also decreases. Accordingly, the influence of the doping concentration in the periphery becomes larger and the pinning voltage is eventually predominantly determined by the horizontal electric field in the submicrometer region. In this case, the analytical model describing the conventional photodiode structure is no longer applicable. Therefore, in this article, a simple analytical model applicable to a small pixel size is provided and verified through TCAD simulation. It is thought that the proposed simple model helps understand the potential of small pixel size and provides a major starting point for design.
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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)
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