Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Measurement of the activation volume in magnetic random access memoryopen access

Authors
Choi, MoosungCarpenter, RobertGama, Monteiro M.Van Beek, SimonKim, JongryoulCouet, Sebastien
Issue Date
Feb-2023
Publisher
American Institute of Physics Inc.
Citation
Journal of Applied Physics, v.133, no.7, pp 1 - 8
Pages
8
Indexed
SCIE
SCOPUS
Journal Title
Journal of Applied Physics
Volume
133
Number
7
Start Page
1
End Page
8
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/112946
DOI
10.1063/5.0135948
ISSN
0021-8979
1089-7550
Abstract
Measuring thermal stability in magnetic random access memory devices is non-trivial. Recently, there has been much discussion on the appropriate model to use: single domain or domain wall nucleation. Of particular challenge is assessing the maximum size at which the single domain model can be assumed. Typically, this is estimated to be in the range of 20-30 nm based on a value of the exchange stiffness (A e x) that is assumed, estimated using indirect measurements or derived from significantly thicker films. In this work, it is proposed that this maximum size can be measured directly via the activation volume(V a c t) or the activation diameter(D a c t), which originates from the concept of magnetic viscosity. This is conducted by measuring, using the time dependence of magnetization at different applied fields, D a c t in perpendicular magnetic tunnel junction pillars of varying effective anisotropy constant (K e f f) and diameter. It is shown that the trend in D a c t follows 1 / K e f f dependence, in good agreement with the analytic model for the critical diameter of coherent switching. Critically, it is also found that the smallest size for which a single domain, with coherent reversal, occurs is 20 nm. Thus, in devices with technologically relevant values of K e f f, the macrospin model may only be used in 20 nm, or smaller, devices. © 2023 Author(s).
Files in This Item
Go to Link
Appears in
Collections
COLLEGE OF ENGINEERING SCIENCES > DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kim, Jong ryoul photo

Kim, Jong ryoul
ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE