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Degradation in InGaN/GaN-Based Green Light-Emitting Diodes Investigated by Applied Voltage/Current Mapping
- Authors
- 신동수
- Issue Date
- 1-Jun-2023
- Place
- Ramada Plaza Jeju Hotel, Jeju, Korea
- Conference Name
- CSW 2023
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Related Researcher
- Shin, Dong Soo
- ERICA 첨단융합대학 (ERICA 반도체·디스플레이공학전공)