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Deep Learning-Based Defect Detection Framework for Ultra High Resolution Images of Tunnelsopen access

Authors
Lee, KisuLee, SanghyoKim, Ha Young
Issue Date
Jan-2023
Publisher
MDPI Open Access Publishing
Keywords
deep learning; defect detection; postprocessing; preprocessing; tunnel inspection system; ultra-high resolution
Citation
Sustainability, v.15, no.2, pp 1 - 15
Pages
15
Indexed
SCIE
SSCI
SCOPUS
Journal Title
Sustainability
Volume
15
Number
2
Start Page
1
End Page
15
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/118935
DOI
10.3390/su15021292
ISSN
2071-1050
Abstract
This study proposes a defect detection framework to improve the performance of deep learning-based detection models for ultra-high resolution (UHR) images generated by tunnel inspection systems. Most of the scanning technologies used in tunnel inspection systems generate UHR images. Defects in real-world images, on the other hand, are noticeably smaller than the image. These characteristics make simple preprocessing applications, such as downscaling, difficult due to information loss. Additionally, when a deep learning model is trained by the UHR images under the limited computational resource for training, problems may occur, including a reduction in object detection rate, unstable training, etc. To address these problems, we propose a framework that includes preprocessing and postprocessing of UHR images related to image patches rather than focusing on deep learning models. Furthermore, it includes a method for supplementing problems according to the format of the data annotation in the preprocessing process. When the proposed framework was applied to the UHR images of a tunnel, the performance of the deep learning-based defect detection model was improved by approximately 77.19 percentage points (pp). Because the proposed framework is for general UHR images, it can effectively recognize damage to general structures other than tunnels. Thus, it is necessary to verify the applicability of the defect detection framework under various conditions in future works. © 2023 by the authors.
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LEE, SANG HYO
ERICA 공학대학 (MAJOR IN BUILDING INFORMATION TECHNOLOGY)
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