Automatic test case generation of automotive smart key system using genetic algorithm

임동진

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Automatic test case generation of automotive smart key system using genetic algorithm

Authors: 임동진

Issue Date: 22-May-2015

URI: https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/120268

Conference Name: Proceedings of 2015 JSAE Annual Congress

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Appears in Collections: COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 2. Conference Papers

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