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Feature Extraction Techniques from Contaminated-Insulator Leakage Current Data for Deep Learning Applications in Condition Monitoring of High Voltage Insulators
- Authors
- 이방욱
- Issue Date
- 22-Oct-2024
- Place
- 강릉 세인트존스호텔
- Conference Name
- CMD 2024
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Related Researcher
- Lee, Bang Wook
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)