Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
DDR4 DIMM의 고온 동작 실험에 따른 I/O 마진의 변화
- Authors
- 백상현
- Issue Date
- Jun-2019
- Conference Name
- 2019 Korea Test Conference
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)