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DDR4 SDRA에서 DQS에 따른 I/O 마진 값의 변화
- Authors
- 백상현
- Issue Date
- Jun-2017
- Conference Name
- 2017 Korea Test Conference
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)