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SoC 테스트 비용 절감을 위한 다중 테스트기술
- Authors
- 박성주
- Issue Date
- Feb-2008
- Conference Name
- 2008년 IT-컨버전스 합동학술대회
- Place
- 대한민국
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Collections - COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 2. Conference Papers
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