A Probabilistic Diagnose Model of Product Defect by Partially Shuffled Equipment Data

허선

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A Probabilistic Diagnose Model of Product Defect by Partially Shuffled Equipment Data

Authors: 허선

Issue Date: 23-Nov-2019

URI: https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/124862

Conference Name: EAWIE 2019

Place: 대만
Taipei, Taiwan

Conference Date: 2019-11-20 ~ 2019-11-23

Conference Name: The 6th East Asia Workshop on Industrial Engineering(EAWIE 2019)

Files in This Item: There are no files associated with this item.

Appears in Collections: COLLEGE OF ENGINEERING SCIENCES > DEPARTMENT OF INDUSTRIAL & MANAGEMENT ENGINEERING > 2. Conference Papers

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Hur, Sun: ERICA 공학대학 (DEPARTMENT OF INDUSTRIAL & MANAGEMENT ENGINEERING)

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