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Dose Measurements and Effects in DRAMs During PCB Inspections Using X-rays
- Authors
- 백상현
- Issue Date
- Jul-2024
- Publisher
- NSREC - IEEE Nuclear & Space Radiation Effects Conference
- Citation
- NSREC - IEEE Nuclear & Space Radiation Effects Conference, pp 1 - 4
- Pages
- 4
- Indexed
- FOREIGN
- Journal Title
- NSREC - IEEE Nuclear & Space Radiation Effects Conference
- Start Page
- 1
- End Page
- 4
- Abstract
- Under the PCB inspection environment, TID levels were measured for various combinations of filters, PCB, and packages to demonstrate significant variances in TID effects by X-rays. Retention-time degradations were compared for 1y-nm DRAM components.
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)