A New High-Frequency Characterization for Coupled Transmission Lines Fabricated on Lossy Organic Substrates
- Authors
- Kim, Joonhyun; Shin, Junggeun; Lee, Donghun; Eo, Yungseon
- Issue Date
- Feb-2020
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- Coupled transmission lines; high-frequency measurement; modeling; organic material; scattering parameters
- Citation
- IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.10, no.2, pp 272 - 279
- Pages
- 8
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY
- Volume
- 10
- Number
- 2
- Start Page
- 272
- End Page
- 279
- URI
- https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/1313
- DOI
- 10.1109/TCPMT.2019.2962831
- ISSN
- 2156-3950
2156-3985
- Abstract
- In this article, a novel experimental characterization technique for coupled transmission lines fabricated on organic substrates is presented. The high-frequency characterizations of transmission lines fabricated on organic substrates are extremely difficult due to parasitic resonances. We eliminated the parasitic resonance effects by combining physical circuit models with experimental characterizations. The reconstructed coupled transmission-line parameters obtained using the proposed technique are compared from 10 MHz to 40 GHz with the measurement data using a vector network analyzer (VNA). The transmission-line parameters using S-parameter measurement data are too contaminated with external noise, whereas those using the proposed technique can effectively eliminate the parasitic effects.
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Collections - COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles
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