Dithering Loopback-Based Prediction Technique for Mixed-Signal Embedded System Specifications
- Authors
- Kim, Byoungho
- Issue Date
- Feb-2016
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- Analog-to-digital converter (ADC); digital-toanalog converter (DAC); loopback test; mixed-signal testing
- Citation
- IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.63, no.2, pp.121 - 125
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
- Volume
- 63
- Number
- 2
- Start Page
- 121
- End Page
- 125
- URI
- https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/14552
- DOI
- 10.1109/TCSII.2015.2482419
- ISSN
- 1549-7747
- Abstract
- Lower cost test solutions are required to overcome high test cost issue of conventional characterization for the mixed-signal circuits, which is primarily caused by test equipment cost. This brief proposes a cost-effective self-characterization technique that accurately predicts the harmonics of individual mixed-signal circuits by dithering a loopback path with Gaussian-distributed noise. A set of scale factors is applied to the dithered root-mean-square noise. The different scale factors yield a corresponding change in the harmonic magnitudes of the loopback responses. Based on this, we derive a precise nonlinear loopback behaviormodel to quantitatively identify the harmonics of a device under test. The results show that the proposed method can be used for practical characterization.
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