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Photoelectrochemical oxygen evolution improved by a thin Al2O3 interlayer in a NiOx/n-Si photoanode

Authors
Park, Min-JoonJung, Jin-YoungShin, Sun-MiSong, Jae-WonNam, Yoon-HoKim, Dong-HyungLee, Jung-Ho
Issue Date
Jan-2016
Publisher
Elsevier Sequoia
Keywords
Silicon; Photoanode; Aluminum trioxide; Interlayer; Nickel oxide; Catalyst; Oxygen evolution reaction; Photoelectrochemical cell
Citation
Thin Solid Films, v.599, pp.54 - 58
Indexed
SCIE
SCOPUS
Journal Title
Thin Solid Films
Volume
599
Start Page
54
End Page
58
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/14572
DOI
10.1016/j.tsf.2015.12.062
ISSN
0040-6090
Abstract
We employ a thin Al2O3 interlayer between p-NiOX catalyst/n-Si photoanode interfaces to realize an effective oxygen evolution reaction (OER). The Al2O3 interlayer is used to reduce the interface defect density, enhance the band bending by suppressing the Fermi-level pinning effect, and enhance photovoltage at the catalyst/ semiconductor rectifying junction. Our NiOX/Al2O3/n-Si photoanodes generated a photocurrent of 3.36 mA/cm(2) at the equilibrium potential of OER (E-OER = 1.23 V vs. reversible hydrogen electrode in 1 M NaOH solution) and a solar-to-oxygen conversion efficiency of 0.321%. Moreover, the photoanode showed no sign of decay over 20 h of photoelectrochemical water oxidation. (C) 2015 Elsevier B.V. All rights reserved.
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Lee, Jung-Ho
ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)
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